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SGP30N60HS sgw30n60hs power semiconductors 1 preliminary / rev.1 may-03 high speed igbt in npt-technology ? 30% lower e off compared to previous generation ? short circuit withstand time ? 10 s ? designed for operation above 30 khz ? npt-technology for 600v applications offers: - parallel switching capability - moderate e off increase with temperature - very tight parameter distribution ? high ruggedness, temper ature stable behaviour ? complete product spectrum and pspice models : http://www.infineon.com/igbt/ type v ce i c e off) t j package ordering code SGP30N60HS 600v 30 480j 150 c to-220ab q67040-s4500 sgw30n60hs 600v 30 480j 150 c to-247ac q67040-s4501 maximum ratings parameter symbol value unit collector-emitter voltage v ce 600 v dc collector current t c = 25 c t c = 100 c i c 41 30 pulsed collector current, t p limited by t jmax i cpuls 112 turn off safe operating area v ce 600v, t j 150 c - 112 a avalanche energy single pulse i c = 20a, v cc =50v, r ge =25 ? start t j =25 c e as 165 mj gate-emitter voltage static transient ( t p <1s, d <0.05) v ge 20 30 v short circuit withstand time 1) v ge = 15v, v cc 600v, t j 150 c t sc 10 s power dissipation t c = 25 c p tot 250 w operating junction and storage temperature t j , t stg -55...+150 time limited operating junction temperature for t < 150h t j(tl) 175 soldering temperature, 1.6mm (0.063 in.) from case for 10s - 260 c 1) allowed number of short circuits: <10 00; time between short circuits: >1s. g c e p-to-247-3-1 (to-247ac) p-to-220-3-1 (to-220ab)
SGP30N60HS sgw30n60hs power semiconductors 2 preliminary / rev.1 may-03 thermal resistance parameter symbol conditions max. value unit characteristic igbt thermal resistance, junction ? case r thjc 0.5 k/w thermal resistance, junction ? ambient r thja to-220ab to-247ac 62 40 electrical characteristic, at t j = 25 c, unless otherwise specified value parameter symbol conditions min. typ. max. unit static characteristic collector-emitter breakdown voltage v (br)ces v ge =0v, i c =500 a 600 - - collector-emitter saturation voltage v ce(sat) v ge = 15v, i c =30a t j =25 c t j =150 c 2.8 3.5 3.15 4.00 gate-emitter threshold voltage v ge(th) i c =700 a, v ce = v ge 3 4 5 v zero gate voltage collector current i ces v ce =600v, v ge =0v t j =25 c t j =150 c - - - - 40 3000 a gate-emitter leakage current i ges v ce =0v, v ge =20v - - 100 na transconductance g fs v ce =20v, i c =30a - 20 - s dynamic characteristic input capacitance c iss - 1500 output capacitance c oss - 150 reverse transfer capacitance c rss v ce =25v, v ge =0v, f =1mhz - 92 pf gate charge q gate v cc =480v, i c =30a v ge =15v - 141 nc internal emitter inductance measured 5mm (0.197 in.) from case l e t o-2 47 ac - 13 nh short circuit collector current 1) i c(sc) v ge =15v, t sc 10 s v cc 600v, t j 150 c - 220 a 1) allowed number of short circuits: <1 000; time between short circuits: >1s.
SGP30N60HS sgw30n60hs power semiconductors 3 preliminary / rev.1 may-03 switching characteristic, inductive load, at t j =25 c value parameter symbol conditions min. typ. max. unit igbt characteristic turn-on delay time t d(on) - 20 rise time t r - 21 turn-off delay time t d(off) - 250 fall time t f - 25 ns turn-on energy e on - 0.60 turn-off energy e off - 0.55 total switching energy e ts t j =25 c, v cc =400v, i c =30a, v ge =0/15v, r g =11 ? l 1) =60nh, c 1) =40pf energy losses include ?tail? and diode reverse recovery. - 1.15 mj switching characteristic, inductive load, at t j =150 c value parameter symbol conditions min. typ. max. unit igbt characteristic turn-on delay time t d(on) - 16 rise time t r - 13 turn-off delay time t d(off) - 122 fall time t f - 29 ns turn-on energy e on - 0.78 turn-off energy e off - 0.48 total switching energy e ts t j =150 c v cc =400v, i c =30a, v ge =0/15v, r g = 1.8 ? l 1) =60nh, c 1) =40pf energy losses include ?tail? and diode reverse recovery. - 1.26 mj turn-on delay time t d(on) - 20 rise time t r - 19 turn-off delay time t d(off) - 274 fall time t f - 27 ns turn-on energy e on - 0.91 turn-off energy e off - 0.70 total switching energy e ts t j =150 c v cc =400v, i c =30a, v ge =0/15v, r g = 11 ? l 1) =60nh, c 1) =40pf energy losses include ?tail? and diode reverse recovery. - 1.61 mj 1) leakage inductance l a nd stray capacity c due to test circuit in figure e.
SGP30N60HS sgw30n60hs power semiconductors 4 preliminary / rev.1 may-03 i c , collector current 10hz 100hz 1khz 10khz 100khz 0a 20a 40a 60a 80a 100a t c =80c t c =110c i c , collector current 1v 10v 100v 1000v 0,1a 1a 10a 100a t p =4s 15s 200s 1ms 50s dc f , switching frequency v ce , collector - emitter voltage figure 1. collector current as a function of switching frequency ( t j 150 c, d = 0.5, v ce = 400v, v ge = 0/+15v, r g = 11 ? ) figure 2. safe operating area ( d = 0, t c = 25 c, t j 150 c; v ge =15v) p tot , power dissipation 25c 50c 75c 100c 125c 0w 50w 100w 150w 2 00w i c , collector current 25c 75c 125c 0a 10a 20a 30a 40a t c , case temperature t c , case temperature figure 3. power dissipation as a function of case temperature ( t j 150 c) figure 4. collector current as a function of case temperature ( v ge 15v, t j 150 c) limited by bond wire i c i c
SGP30N60HS sgw30n60hs power semiconductors 5 preliminary / rev.1 may-03 i c , collector current 0v 2v 4v 6v 0a 10a 2 0a 3 0a 4 0a 5 0a 6 0a 7 0a 8 0a 5v 7v 9v 11v 13v 15v v ge =20v i c , collector current 0v 2v 4v 6v 0a 10a 20a 30a 40a 50a 60a 70a 80a 5v 7v 9v 11v 15v 13v v ge =20v v ce , collector - emitter voltage v ce , collector - emitter voltage figure 5. typical output characteristic ( t j = 25c) figure 6. typical output characteristic ( t j = 150c) i c , collector current 0v 2v 4v 6v 8v 0a 2 0a 4 0a 6 0a 8 0a 150c 25c t j =-55c v ce(sat), collector - emitt saturation voltage -50c 0c 50c 100c 150c 1,0v 1,5v 2,0v 2,5v 3,0v 3,5v 4,0v 4,5v 5,0v 5,5v i c =60a i c =30a i c =15a v ge , gate-emitter voltage t j , junction temperature figure 7. typical transfer characteristic (v ce =10v) figure 8. typical collector-emitter saturation voltage as a function of junction temperature ( v ge = 15v)
SGP30N60HS sgw30n60hs power semiconductors 6 preliminary / rev.1 may-03 t, switching times 0a 10a 20a 30a 40a 50a 10ns 1 00ns t r t d(on) t f t d(off) t, switching times 0? 5? 10? 15? 20? 25? 10 ns 100 ns t f t r t d(off) t d(on) i c , collector current r g , gate resistor figure 9. typical switching times as a function of collector current (inductive load, t j =150c, v ce =400v, v ge =0/15v, r g =11 ? , dynamic test circuit in figure e) figure 10. typical switching times as a function of gate resistor (inductive load, t j =150c, v ce =400v, v ge =0/15v, i c =30a, dynamic test circuit in figure e) t, switching times 0c 50c 100c 150c 10ns 100ns t f t r t d(on) t d(off) v ge(th ) , gate - emitt trshold voltage -50c 0c 50c 100c 150c 1,0v 1,5v 2,0v 2,5v 3,0v 3,5v 4,0v 4,5v 5,0v 5,5v min. typ. max. t j , junction temperature t j , junction temperature figure 11. typical switching times as a function of junction temperature (inductive load, v ce =400v, v ge =0/15v, i c =30a, r g =11 ? , dynamic test circuit in figure e) figure 12. gate-emitter threshold voltage as a function of junction temperature ( i c = 0.7ma)
SGP30N60HS sgw30n60hs power semiconductors 7 preliminary / rev.1 may-03 e , switching energy losses 0a 10a 20a 30a 40a 50a 60a 0 ,0mj 1,0mj 2 ,0mj 3 ,0mj 4 ,0mj 5 ,0mj e off *) e on and e ts include losses due to diode recovery e on * e , switching energy losses 0? 5? 10? 15? 20? 25? 30? 0,0 mj 0,5 mj 1,0 mj 1,5 mj 2,0 mj 2,5 mj 3,0 mj e on * *) eon and ets include losses due to diode recovery e ts * e off i c , collector current r g , gate resistor figure 13. typical switching energy losses as a function of collector current (inductive load, t j =150c, v ce =400v, v ge =0/15v, r g =11 ? , dynamic test circuit in figure e) figure 14. typical switching energy losses as a function of gate resistor (inductive load, t j =150c, v ce =400v, v ge =0/15v, i c =30a, dynamic test circuit in figure e) e , switching energy losses 0c 50c 100c 150c 0 ,0mj 0 ,5mj 1,0mj 1,5mj *) e on and e ts include losses due to diode recovery e ts * e on * e off z thjc , transient thermal resistance 1s 10s 100s 1ms 10ms 100ms 10 -4 k/w 10 -3 k/w 10 -2 k/w 10 -1 k/w single pulse 0.01 0.02 0.05 0.1 0.2 d =0.5 t j , junction temperature t p , pulse width figure 15. typical switching energy losses as a function of junction temperature (inductive load, v ce =400v, v ge =0/15v, i c =30a, r g =11 ? , dynamic test circuit in figure e) figure 16. igbt transient thermal resistance ( d = t p / t ) c 1 = 1 r 1 r 1 r 2 c 2 = 2 r 2 r ,(k/w) , (s) 0.3681 0.0555 0.0938 1.26e-03 0.038 1.49e-04
SGP30N60HS sgw30n60hs power semiconductors 8 preliminary / rev.1 may-03 v ge , gate - emitter voltage 0nc 50nc 100nc 150nc 0v 5v 10v 15v 480v 120v c, capacitance 0v 10v 20v 10pf 100pf 1nf c rss c oss c iss q ge , gate charge v ce , collector - emitter voltage figure 17. typical gate charge ( i c =30 a) figure 18. typical capacitance as a function of collector-emitter voltage ( v ge =0v, f = 1 mhz) t sc , short circuit withstand time 10v 11v 12v 13v 14v 0s 5s 10s 15s i c(sc) , short circuit collector current 10v 12v 14v 16v 18v 0a 50a 100a 150a 200a 250a 300a v ge , gate - emitetr voltage v ge , gate - emitetr voltage figure 19. short circuit withstand time as a function of gate-emitter voltage ( v ce =600v , start at t j = 25c ) figure 20. typical short circuit collector current as a function of gate- emitter voltage ( v ce 600v, t j 150 c)
SGP30N60HS sgw30n60hs power semiconductors 9 preliminary / rev.1 may-03 dimensions symbol [mm] [inch] min max min max a 9.70 10.30 0.3819 0.4055 b 14.88 15.95 0.5858 0.6280 c 0.65 0.86 0.0256 0.0339 d 3.55 3.89 0.1398 0.1531 e 2.60 3.00 0.1024 0.1181 f 6.00 6.80 0.2362 0.2677 g 13.00 14.00 0.5118 0.5512 h 4.35 4.75 0.1713 0.1870 k 0.38 0.65 0.0150 0.0256 l 0.95 1.32 0.0374 0.0520 m 2.54 typ. 0.1 typ. n 4.30 4.50 0.1693 0.1772 p 1.17 1.40 0.0461 0.0551 t 2.30 2.72 0.0906 0.1071 to-220ab dimensions symbol [mm] [inch] min max min max a 4.78 5.28 0.1882 0.2079 b 2.29 2.51 0.0902 0.0988 c 1.78 2.29 0.0701 0.0902 d 1.09 1.32 0.0429 0.0520 e 1.73 2.06 0.0681 0.0811 f 2.67 3.18 0.1051 0.1252 g 0.76 max 0.0299 max h 20.80 21.16 0.8189 0.8331 k 15.65 16.15 0.6161 0.6358 l 5.21 5.72 0.2051 0.2252 m 19.81 20.68 0.7799 0.8142 n 3.560 4.930 0.1402 0.1941 ? p 3.61 0.1421 q 6.12 6.22 0.2409 0.2449 to-247ac
SGP30N60HS sgw30n60hs power semiconductors 10 preliminary / rev.1 may-03 figure a. definition of switching times figure b. definition of switching losses p(t) 12 n t(t) j 1 1 2 2 figure d. thermal equivalent circuit figure e. dynamic test circuit leakage inductance l =60nh a nd stray capacity c =40pf.
SGP30N60HS sgw30n60hs power semiconductors 11 preliminary / rev.1 may-03 published by infineon technologies ag , bereich kommunikation st.-martin-strasse 53, d-81541 mnchen ? infineon technologies ag 2001 all rights reserved. attention please! the information herein is given to describe certain compon ents and shall not be considered as warranted characteristics. terms of delivery and rights to technical change reserved. we hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. infineon technologies is an approved cecc manufacturer. information for further information on technology, delivery terms and c onditions and prices please contact your nearest infineon technologies office in germany or our infineon techno logies representatives wo rldwide (see address list). warnings due to technical requirements components may contain danger ous substances. for information on the types in question please contact your neares t infineon technologies office. infineon technologies components may only be used in life- support devices or systems with the express written approval of infineon technologies, if a failure of such co mponents can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or sy stem. life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. if they fail, it is reasonable to assume that the health of the user or other persons may be endangered.

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